Nano-Observer II
High resolution Atomic Force Microscope by CSInstruments, France. Distributed and supported in Singapore by Frontier Scientific.
The Flexible Research AFM
Nano-Observer II: your research AFM
The Nano-Observer II is a cutting-edge Atomic Force Microscope designed for both advanced researchers and newcomers. Its versatility and user-friendly software make it the ideal tool for nanoscale imaging and characterization across diverse applications, enabling precise electrical, mechanical and environmental measurements.
The system is built around the new Galaxy USB 24-bit low-noise AFM controller with high-quality built-in lock-ins for Phase, PFM, EFM, KFM and more, and delivers consistent resolution across all scan sizes with a single scanner.
AutoScan software, Auto Approach, AutoGain and preset setpoint conditions (Soft, Medium or Hard) keep every step simple and reproducible, while the configurable top and side camera makes the pre-approach easy.
Main Capabilities of the Nano-Observer II
ResiScope™
Resistance from 10² to 10¹² ohms and current from femtoamperes to microamperes: 10 decades in a single scan, with real-time active gain control, a linear amplifier design and smart active current protection. Ideal for batteries, photovoltaics, semiconductors and 2D materials.
HD-KFM
Harmonic Detection Kelvin Force Microscopy: single-pass KPFM without lift-mode artifacts, operating at ~350–400 kHz on the cantilever’s second eigenmode. <10 nm resolution, sub-surface sensitivity and Electric Field Cancelling (EFC) for pure MFM.
Soft Interaction Control
The third AFM mode: constant force at each pixel with zero lateral tip-sample contact. No friction, no sample damage, quantitative results on polymers, biomaterials and thin films. Compatible with Soft-ResiScope™, Soft-PFM, Soft-SThM and Soft-MEKA.
Motorized Stage (New)
0.5 µm step resolution and 25 mm × 25 mm travel range. Point, click, measure: the software navigates to each site and starts the measurement automatically, for large-sample mapping and high-throughput statistical workflows.
EZ TEMP Temperature Control
In-situ AFM measurements from -40°C to +450°C, compatible with contact mode, oscillating mode, EFM, MFM and electrical characterization modes: phase transitions, crystallization studies and thermal stability analysis.
Environments & Coupling
Glove box integration for air-sensitive samples, EZ Liquids fluid cell and electrochemistry, gas and humidity control, and large optical windows for coupling with Raman, photovoltaics and IR illumination, including AFM-IR nano-spectroscopy.
Same Probe, Same Location
Switch between advanced modes without touching the hardware. 8 real-time image channels increase the capability of analysis.
Correlated Soft-ResiScope™ and HD-KFM maps on the same 50×50 µm battery electrode area
HD-KFM layer-by-layer work function contrast on graphene, 1ML to 4ML
Specifications
| Standard mode | CSInstruments technology |
|---|---|
| Scanner XY range | 100 µm × 100 µm, closed loop |
| Controller | Galaxy USB 24-bit, low noise, with built-in lock-ins |
| Standard modes | Contact, Tapping, Phase, Lateral Force, PFM, C-AFM, MFM, EFM, KFM, Force Modulation |
| Advanced modes | ResiScope™, HD-KFM, Soft Interaction Control (Soft-ResiScope™, Soft-PFM, Soft-SThM, Soft-MEKA) |
| Electrical range | 10² to 10¹² Ω and fA to µA, single scan |
| Motorized stage (option) | 0.5 µm step resolution, 25 mm × 25 mm travel range |
| Temperature control | EZ TEMP: -40°C to +450°C |
| Environments | Glove box, liquid, gas / humidity control, optical coupling (UV, IR, Raman) |
Full technical detail on each mode: see our Advanced AFM Modes page. Upgrading an existing AFM instead? See the Galaxy Dual Controller.
Request a Quotation or Demonstration
Frontier Scientific provides local sales, applications support and service for CSInstruments AFM systems in Singapore.