From standard imaging to advanced characterization: one controller, endless possibilities. A second life for the AFM you already own, distributed and supported in Singapore by Frontier Scientific.
Discover the Galaxy Dual Controller by CSInstruments, a cutting-edge upgrade for your existing Atomic Force Microscope. This controller breathes new life into legacy AFM systems by combining advanced imaging modes with intuitive software: the perfect solution for researchers seeking enhanced capabilities without the cost of a complete system replacement.
With seamless integration, state of the art electronics and access to high-resolution imaging and new advanced AFM modes, the Galaxy Dual brings new performance and flexibility, all through an intuitive software interface.
One controller upgrades a wide range of legacy AFM systems
10 decades quantitative resistance and conductivity mapping: 10² to 10¹² ohms and currents from femtoamperes to microamperes, with real-time active gain control and smart active current protection.
Next generation Harmonic Detection KPFM imaging: single pass without lift-mode artifacts, high frequency (~350–400 kHz), with Electric Field Cancelling (EFC) for pure MFM.
Frictionless constant-force AFM for non-destructive quantitative measurements, compatible with Soft-ResiScope™, Soft-PFM, Soft-SThM and Soft-MEKA.
Multimode and Dimension D3000 / D3100: existing modes stay intact, while CCD camera and motorized stage control are integrated for point, click and measure automated workflows.
MI, Agilent and Keysight series: 5500, 5600, 54×0 series and PicoSPM. One controller brings HD-KFM, ResiScope™ and Soft Interaction Control to each of them.
User testimony, UFABC: researchers share their experience after upgrading an Agilent 5500 system with the Galaxy Dual Controller.
To enhance our capabilities, we recently upgraded our MultiMode AFM with CSI’s Galaxy Dual Controller. This upgrade has breathed new life into our existing system, significantly expanding its functionality.
Dr. Haruki Sakaguchi, Institute of Advanced Energy, Kyoto University. Research on graphene nanoribbons published in Nature Communications.
| Standard mode | CSInstruments technology |
|---|---|
| XY scan range | 100 µm (tolerance +/- 10%) |
| Z range | 15 µm (tolerance +/- 10%) |
| XY drive resolution | 24-bit control |
| Z drive resolution | 24-bit control |
| Advanced modes | ResiScope™ (10² to 10¹² ?, fA to µA), HD-KFM, Soft Interaction Control |
| Compatible systems | Bruker Multimode, Dimension 3000 / 3100, Agilent / Keysight 5500, 5600, 54×0 series, PicoSPM / 4500, Nano-Observer I & II |
Already upgraded? Moving up to the Nano-Observer II needs no new controller: your existing investment carries forward. Full mode detail: Advanced AFM Modes.